Call for Papers

AES 2019, the 7th Advanced Electromagnetics Symposium will serve as an international multidisciplinary forum for the exchange of information on state-of-the-art research in antennas, propagation, electromagnetic engineering, and radio science.

AES 2019 topics include, but are not limited to:

Track 1: Antennas
  • Analysis, design, and development of antennas and arrays
  • Wide-band antennas
  • Empirical, theoretical, and computational models of antennas
  • Material properties and their applications in antennas
  • Reconfigurable and tunable antennas, optical and nano antennas
  • Antenna arrays and MIMO systems
  • Signal processing for antennas
Track 2: Wave Propagation
  • Theoretical and computational methods for wave propagation and sensing
  • Characterization of propagation channels
  • Applications in wireless communications, radar, and imaging systems
  • Multiple antenna systems for spatial, polarization, pattern,...
Track 3: Measurements
  • Measurement techniques for antennas, radiation, propagation, and scattering
  • Specification, and standards
  • Visualization of electromagnetic entities
  • Near-field and novel measurement techniques
Track 4: Electromagnetics
  • Fundamental and advanced theory
  • Radiation, scattering, radar cross section, propagation, and interaction with all media
  • Inverse scattering and target identification
  • Electromagnetic absorbers and artificial materials (metamaterials,...)
  • Computational electromagnetics, fast algorithms, and CAD packages
  • Educational Electromagnetics
Track 5: Microwaves, Millimeter Waves, and THz
  • Solid state circuits, low-noise circuits, and high-power circuits, monolithic integrated circuits passive circuits, packaging, interconnects, MCMs, and MEMS
  • Ferrite and SAW components, superconducting components and technology
  • Microwave-Optical design, high speed digital circuits and SI, submillimeter wave techniques
  • THz technology, measurement, and imaging
Track 6: EMC & EMI
  • EMC and EMI modeling, EMC test methods in industry, environment, near-field probers, functional safety NF scanning for PCB characterization,...